Abstract: Wafer maps provide important information for engineers in identifying root causes of die failures during semiconductor manufacturing processes. We present a method for wafer map defect ...

Abstract: Defect pattern recognition (DPR) of wafer maps is critical for determining the root cause of production defects, which can provide insights for the yield improvement in wafer foundries.

Pattern Beauty is prioritizing brand awareness after six years of “tremendous growth,” co-chief executive officer Christiane Pendarvis said, while targeting longer-term global expansion following its ...

Jon McCormack's new book celebrates the whorls, hexagons, and half-moons that appear in the world all around us. A 400-million-year-old ammonite cross-section reveals an interior world of remarkable ...