IEEE

A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit

Abstract: This paper proposes a test and repair scheme for 3DICs based on Hybrid IEEE1838 Die Wrapper Register(DWR) and Build In Self-Test(BIST) circuit, The fault location of interconnect interface ...
IEEE

SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

Abstract: We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST (SymBIST). SymBIST exploits inherent symmetries in ...